CIMdata PLM Industry Summary Online Archive
13 March 2007
Events News
Hanover Fair: PLM Solutions From CENIT Optimise the Production Capacity of the Electronics Industry and Mechanical Engineering
CENIT will be exhibiting an interface for the exchange of data between Electronic Design Automation (EDA) tools and SAP in hall 17 (booth E66) at this year's digital factory at the Hanover Fair from 16 April to 20 April 2007. This direct integration between mechanical, electronic and SAP systems enables continuous SAP PLM processes in this field for the first time.
Following the integration of mechanical engineering with the CENIT software CDI in SAP, CENIT will be presenting, in the form of the new EDA/eCAD interface, another innovative solution to increase efficiency in the collaboration between ERP and the world of design at the Hanover Fair. The standardised SAP integration of these important disciplines will make a major contribution to increasing quality in product development in the electronics industry. The linking of all documents (or elements from mechanics, electronics and software) belonging to a product configuration ensures data transparency and documentation for all relevant areas and beyond.
Tailor-made solutions for mechanical engineering
Mechanical engineering generates a substantial proportion (32%) of total sales from product innovations. Together with Dassault Systèmes, CENIT wants to further support and optimise market-driven, rapid development in this area. To this end, visitors to the Hanover Fair will be offered a special promotion for solutions in the field of CATIA V5 in mechanical engineering.
Collaboration in the digital factory
Another focal point of this year's appearance by CENIT is providing support for digital production planning using DELMIA-based approaches which have been tried and tested in practice. For example, the fundamental improvement of collaboration between all those involved in planning. The advantages of direct access to the product geometry will also be explained: planning errors can thus be recognised at an early stage and avoided. Clear strategies for the reuse of plans already drawn up will round off this topic.
Learn more: http://www.cenit.de/hannovermesse .
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